Particle characterization – systems for particle size and shape analysis.
In the chemical and pharmaceutical industry, particle size and shape, but also e.g. charge and color and thus particle characterization are the focus of interest.
Dynamic image analysis (DIA), static laser light scattering (SLS, also known as laser diffraction) and sieve analysis are the most common methods for particle size measurement.
Each method has a characteristic size range in which measurements are possible. These measurement ranges partially overlap.
Particle measurement systems are often additionally equipped with dispersing units.
Particle size distribution analyzer
Description
Particle characterization – systems for particle size and shape analysis.
In the chemical and pharmaceutical industry, particle size and shape, but also e.g. charge and color and thus particle characterization are the focus of interest.
Dynamic image analysis (DIA), static laser light scattering (SLS, also known as laser diffraction) and sieve analysis are the most common methods for particle size measurement.
Each method has a characteristic size range in which measurements are possible. These measurement ranges partially overlap.
Particle measurement systems are often additionally equipped with dispersing units.
Particle characterization – systems for particle size and shape analysis. In the chemical and pharmaceutical industry, particle size and shape, but also e.g. charge and color and thus particle characterization are the focus of interest. Dynamic image analysis (DIA), static laser light scattering (SLS, also known…
Particle characterization – systems for particle size and shape analysis. In the chemical and pharmaceutical industry, particle size and shape,…
Suppliers
The following suppliers offer Particle size distribution analyzer products.