Description
A scanning electron microscope (SEM) is an electron microscope in which an electron beam is passed (rastered) in a specific pattern over the object to be magnified and interactions of the electrons with the object are used to produce an image of the object. The images…
A scanning electron microscope (SEM) is an electron microscope in which an electron beam is passed (rastered) in a specific…
Suppliers
The following suppliers offer Microscopes - Scanning electron microscope REM products.
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Avantor – VWR International GmbH
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Thermo Fisher Scientific (Schweiz) AG
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Leica Microsystems AG
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Nikon GmbH
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Portmann Instruments AG
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Ryf AG
Labfinder Shop
The following shop items are available from the suppliers
