Particle analyzers general
Particle characterization – systems for particle size and shape analysis. In the chemical and pharmaceutical industry, particle size and shape, but also e.g. charge and color and thus particle characterization are the focus of interest. Dynamic image analysis (DIA), static laser light scattering (SLS, also known as laser diffraction) and sieve analysis are the most common methods for particle size measurement. Each method has a characteristic size range in which measurements are possible. These measurement ranges partially overlap. Particle measurement systems are often additionally equipped with dispersing units.
Product
Particle analyzers general
Particle characterization – systems for particle size and shape analysis. In the chemical and pharmaceutical industry, particle size and shape, but also e.g. charge and color and thus particle characterization are the focus of interest. Dynamic image analysis (DIA), static laser light scattering (SLS, also known as laser diffraction) and sieve analysis are the most common methods for particle size measurement. Each method has a characteristic size range in which measurements are possible. These measurement ranges partially overlap. Particle measurement systems are often additionally equipped with dispersing units.
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3P Instruments GmbH & Co. KG
Beckman Coulter Int. S.A.
CONTREC AG
Formulaction
GMP SA
HEL Ltd
Particle Measuring Systems | CAS Clean-Air-Service AG
Retsch GmbH
Shimadzu Schweiz GmbH
Sympatec GmbH
Tracomme AG
Wyatt Technology Europe GmbH